Integrated Sensors to Track Aging in Critical ICs
Abstract: Integrated circuits play a critical role in many high-value systems. Applications in aviation, automobiles, automated manufacturing, and many others require strict quality control of the parts that make up their systems. Aging effects in CMOS technologies present a serious issue for the reliability of ICs and may lead to dangerous faults occurring in the system. An approach to mitigate these risks is to design on-chip sensors that estimate device degradation due to specific aging mechanisms so that action may be taken before aging results in a fault. This presentation will discuss the complexities of predicting aging effects and the benefits of integrated aging sensors. An integrated sensor that tracks Negative Bias-Temperature Instability (NBTI) will be presented here, including a comparison with current state of the art NBTI sensors.
Bio: Matt Strong received his B.S. in Nuclear Technologies from Excelsior College in 2017. He joined Prof. Degang Chen’s research group in 2018 where he has researched analog IC design and analysis. His research project participation includes CMOS aging sensor design, analog and mixed signal Design for Test techniques, and hardware security for analog circuits.
Advisor Name: Degang Chen
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