Title: Performance Enhancement Strategies for Design and Test Optimization of Analog and Mixed-Signal Circuits.
Abstract: The demand for integrated circuits (ICs) has surged significantly, driven by their ubiquitous presence across diverse applications including industrial automation, automotive, IoT, and smartphones. In these domains, ICs must meet stringent criteria: reliability, compactness, power efficiency, accuracy, and cost-effectiveness. Addressing these requirements poses distinctive challenges, particularly in designing and testing the analog circuits integral to these ICs.
The quest for compactness often compromises the performance of analog circuits, notably digital-to-analog converters (DACs). Maintaining linearity, the crucial linear relationship between digital input code and analog output, becomes especially challenging across process variations when reducing circuit area. Given the prevalence of DACs in automotive applications, ensuring their reliability in the field is paramount for safe operation. Hence, innovative and computationally efficient methods for in-field DAC linearity measurement are imperative to guarantee lifetime reliability. This presentation introduces a redundancy-based resistor string DAC design, offering reduced area overhead without compromising linearity specifications. Additionally, a Built-In Self-Test (BIST) algorithm for in-field DAC linearity measurement will be presented, enhancing reliability assessment and ensuring optimal performance throughout the operational lifespan.
Biography:Isaac Bruce (Student Member, IEEE) received his B.Sc. degree in Electrical and Electronics engineering from the Kwame Nkrumah University of Science and Technology. He then proceeded to obtain his Masters in Electrical Engineering from the University of Notre Dame. He is currently pursuing a doctorate degree in Electrical and Computer Engineering with emphasis on Analog and Mixed Signal Circuits design and testing at the Iowa State University under the tutelage of Dr. Degang Chen. He is currently focused on solving issues in Multisite testing, a relatively novel technique in Analog circuit testing that drastically reduces test time and consequently test cost. He also focuses on small area DAC design and BIST algorithms for DAC linearity measurement and calibration. His research interests include temperature sensors, low cost and low area data converters and statistical and machine learning algorithms for analog and mixed signal applications.
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