Pattern catalogs

The SEC catalog describes patterns that we intend to apply to high assurance middleware and the applications that use it.

The patterns are described in a “Gang Of Four” like format, with a formal specification of the problem and the solution in XPSL in order to provide associated tool support.

The basic concepts and notations used to formally represent patterns, aspects, refactorings, and rewriting transformations are described in the XPSL Reference.

Current patterns address issues related to:

Control flow

Data integrity

Pointer integrity

Synchronization

Unintended side effects

Multiple interface inheritance

Multiple implementation inheritance

Design by contract and subtyping

Coupling and cohesion

OO metrics

Dynamic resource allocation

In accordance with our overall vision, other pattern catalogs will be defined for other domains, and selected patterns from these various catalogs will be applied to software from a given application domain.

Related documents: Slides | SEC Patterns

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