Pattern catalogs
The SEC catalog
describes patterns that we intend to apply to high assurance middleware and
the applications that use it. The patterns are
described in a “Gang Of Four” like format, with a formal specification of
the problem and the solution in XPSL in order to provide associated tool
support The basic concepts
and notations used to formally represent patterns, aspects, refactorings,
and rewriting transformations are described in the XPSL Reference. Current patterns
address issues related to: Control flow Data integrity Pointer integrity Synchronization Unintended side effects Multiple interface inheritance Multiple implementation inheritance Design by contract and subtyping Coupling and cohesion OO metrics Dynamic resource allocation In accordance with
our overall vision, other pattern catalogs will be defined for other domains,
and selected patterns from these various catalogs will be applied to
software from a given application domain.
