Abstract: Temperature sensors are crucial in almost every application, but their design characteristics such as area, power consumption, accuracy, and detection range vary based on the application. Temperature-to-digital converters have become the preferred sensor design for SoCs since they provide a digital interpretation of the temperature used in different management units. For this Seminar we discuss a proposed simple, low-cost temperature-to-digital converter that uses device and layout matching to cancel the effects of component temperature coefficients and I-V characteristic nonlinearities. This significantly improves area requirements and conversion speed and reduces costs in terms of area and energy per conversion. The design has a wide operation range of -55C to 200C and an inaccuracy of 1.9C, and is implemented in 65nm CMOS technology with a total area of 0.007 mm and an ultra-low energy per conversion of 9nJ.
Bio: In Fall of 2019, Mona began her pursuit of a Ph.D. degree in the ECPE department at Iowa State University under the guidance of Dr. Degang Chen. Since January 2020, she has worked as a research student for the Semiconductor Research Corporation (SRC), where her focus has been on the functional safety and reliability of analog and mixed signal circuits. In addition, she completed an eight-month co-op with NXP in 2022. Mona published eight research papers and holds two patents in her name. Her primary research interests include analog fault detection, analog circuit design, sensor design, and AMS functional safety.
Adviser: Dr. Degang Chen
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