Title: Robust DfT Techniques for Built-in Fault Detection in AMS circuits
Advisor: Degang Chen, professor of ECpE
Abstract: The number of electronic components in mission-critical applications is increasing rapidly and, with the dawn of electric vehicles, this increase is expected to accelerate in the near future. As functional safety (FuSa) is of utmost importance in these applications, the increasing demand for integrated circuits with zero defective parts per million (DPPM) is pressing the chip industry to achieve high defect coverage. In this seminar, we discuss the importance of defect testing to improve the reliability of the system. The seminar also discusses a few simple digital Design for Test (DfT) fault detection techniques for analog and mixed-signal (AMS) circuits.
Biography: Saikiran joined Iowa State University in Fall 2019 as a Ph.D. student in Dr. Degang Chen’s research team. Before joining ISU, Saikiran worked for Texas Instruments for 4 years primarily in the design, validation, and testing of automotive and industrial transceivers. In addition, Saikiran worked as a research trainee at ST Microelectronics and served as an Intern at Robert Bosch and Texas Instruments. Regarding research work, Saikiran has eight research papers, one book article, and one patent in his name. Currently, his primary research interests are analog fault detection, precision circuit design, and aging.