Title: Techniques for design of robust and reliable analog circuits
Speaker: Kushagra Bhathejacid
Abstract: Electronics systems are becoming ubiquitous in safety critical high volume applications. Some of these applications require the integrated circuits to work in extreme environmental conditions for long durations of time making their reliable operation of utmost importance. Digital designs have mature ‘design for testability(DFT)’ and ‘design for reliability(DFR)’ flows. However, their analog counterparts have only recently started catching up.
In this talk we first explore the various reliability problems plaguing analog circuits. We then briefly look at an overview of some methods to improve analog reliability. These include improving test time/cost, on-chip monitoring of degradation phenomenon, on-chip built-in self-test. Finally we get into some details of one of these methods, viz, on—chip built-in self-test.
Bio: Kushagra Bhatheja received M.Eng from BITS, Pilani, India in 2013 and his B.Tech. from IP University, Delhi, India in 2011. He is currently pursuing Ph.D. in electrical and computer engineering at Iowa State University, Ames, IA , USA. In Fall of 2021 he was an intern with Texas Instruments working in the high speed amplifier group. In spring of 2021, he interned with Intel Corporation working on 3D NAND Flash memories. In summer 2019, he was an intern at NXP Semiconductors, Austin, Texas where he worked in the Analog Automotive Group. From 2014-2017 he was employed with ST Microelectronics, India as an engineer in the computational lithography group. From 2013-14 he was with KLA Tencor, working on Optical Semiconductor Inspection. His current interests are analog and mixed signal design, and low cost BIST design for data converters
Advisor: Prof. Degang Chen
Please click this URL to start or join. https://iastate.zoom.us/j/96810972944?pwd=SVVLWlY2cVdZYXhxWWg4ZHF1cVdSZz09
Or, go to https://iastate.zoom.us/join and enter meeting ID: 968 1097 2944 and password: 334840
Join from dial-in phone line:
Dial: +1 309 205 3325 or +1 312 626 6799
Meeting ID: 968 1097 2944
Participant ID: Shown after joining the meeting
International numbers available: https://iastate.zoom.us/u/aqUgrVklM