Graduate Seminar with Ravikiran Yeleswarapu: Addressing Multi-bit Errors in DRAM Subsystem

When

February 6, 2019    
1:10 pm - 2:00 pm

Where

3043 ECpE Building Addition
Coover Hall, Ames, Iowa, 50011

Event Type

Speaker: Ravikiran Yeleswarapu, ECpE Graduate Student

Advisor: Arun K. Somani

Title: Addressing Multi-bit Errors in DRAM Subsystem

Abstract: As DRAM technology continues to evolve towards smaller feature sizes and increased densities, faults in DRAM subsystem are becoming more severe. Current servers mostly use CHIPKILL based schemes to tolerate up-to one/two symbol errors per DRAM beat. Multi-symbol errors arising due to faults in multiple data buses and chips may not be detected by these schemes. In this seminar, we introduce Single Symbol Correction Multiple Symbol Detection (SSCMSD) – a novel error handling scheme to correct single-symbol errors and detect multi-symbol ones.

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