Graduate Seminar- Li Xu

When

April 22, 2016    
1:00 pm - 2:15 pm

Where

2222 Coover Hall
Coover Hall, Ames, Iowa, 50011

Event Type

Speaker: Li Xu
Advisor: Dr. Degang Chen

Title:  A Low Cost Jitter Separation and Characterization Method

Abstract: Clock jitter is a crucial factor in high speed and high performance application. Traditional jitter measurement method relies on precise and expensive instrumentations. This paper proposes a low cost jitter measurement and separation method. Instead of using traditional time internal analysis equipment, a simple ADC is used as the jitter measurement device. The clock under test is applied as the sampling clock of an ADC while the ADC is sampling a full scale sine wave. The ADC does not need to have high linearity and the sine wave signal can be a nonlinear approximate sine wave. Coherent sampling is not needed either. In all cases, the ADC output contains the information of the clock jitter. The proposed algorithm will accurately remove all the effects due to non-coherent sampling, possible amplitude clipping, signal nonlinearity, ADC harmonic distortion, and so on. The algorithm will then separately detect the effects of Periodic Jitterand Random Jitter, and accurately compute the rms value of each jitter component. Because of the very relaxed requirements on the signal source and the ADC, this method offers great potential for wide use in low cost applications and especially in on-chip or on-board jitter measurement applications. Simulation results demonstrate the functionality, accuracy and robustness of the proposed low-cost jitter measurement method.

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